Active Layer Parametrics – Electrical characterization of semiconductors at atomic-level resolution. ALPro Technology has the UNIQUE capability of measuring and depth profiling ALL of the critical electrical properties (mobility, sheet resistance, active carrier concentration) of semiconductor layers at high depth resolution (0.2 – 1nm), rapidly (<1hr).
Visit the Website: AlpInc.net
Meltem Technology designed our Company website and they are actively managing it. The website was designed and hosted rapidly. Murat is a pleasure to work with, easy to communicate with, and has always been prompt to make any changes that we may need. He also suggests innovative solutions to presentation and design (artwork) problems that we face from his vast experience. I hope to continue working with Murat in the future, and I highly recommend him for web design and development needs.
Abhijeet "AJ" Joshi
CTO/Co-Founder at Active Layer Parametrics (ALP), Inc.