Active Layer Parametrics

Active Layer Parametrics website design by Meltem Technology, Inc.

Active Layer Parametrics – Electrical characterization of semiconductors at atomic-level resolution. ALPro Technology has the UNIQUE capability of measuring and depth profiling ALL of the critical electrical properties (mobility, sheet resistance, active carrier concentration) of semiconductor layers at high depth resolution (0.2 – 1nm), rapidly (<1hr).

Visit the Website: AlpInc.net

Active Layer Parametrics website design by Meltem Technology, Inc.
Active Layer Parametrics website design by Meltem Technology, Inc.
Active Layer Parametrics